Multiple Wavemode Scanning for Near and Far-Side Defect Characterisation
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Nondestructive Evaluation
سال: 2020
ISSN: 0195-9298,1573-4862
DOI: 10.1007/s10921-019-0651-0